Welcome! As a Metrology Process Development Engineer in Micron’s Technology Development group (Fab 10) in Singapore, you are responsible for developing new metrology applications and recipes, analyzing the results from measurements, and implementing groundbreaking solutions into our R&D pilot line manufacturing environment! The position will be passionate about high voltage SEM (Scanning Electron Microsope) applications.
In this role, your responsibilities will include, but are not limited to:
- Process Development: Developing high voltage SEM applications on next generation 3D NAND Advanced processes within Fab 10 TD and qualification for technology transfers to high volume manufacturing
- Technology Integration: Driving the understanding of new metrology technology and measurement techniques to ensure that our measurement capabilities meet the technical device roadmaps.
- Collaboration: Partnering with metrology equipment vendors on continuous improvement of software/hardware and development of new measurement techniques.
- Modeling: Identify modeling opportunities using metrology and detection data to explain electrical failed signatures at probe.
- Collaboration: Working closely with process development and process integration engineers to optimize measurements for multiple device process flows and layer stacks
- Equipment Roadmap: Evaluate new and innovative metrology tools to determine the lowest Cost of ownership solutions with the highest accuracy and precision for deployment in R&D and global manufacturing.
- Accuracy Maintenance: Crafting and optimizing the layout of metrology targets to improve measurement quality. Optimizing and maintaining the calibration of metrology systems.
- Reporting: Prepare detailed metrology reports, including data interpretation, conclusions, and recommendations.
What Sets You Apart(required skills, expertise, knowledge, and experience):
- Proficiency in advanced electron microscopy techniques, materials characterization, and data analysis with application to 3D NAND metrology use cases.
- Experience with high voltage SEM and BSE detection based metrology to enable high aspect ratio, overlay, or see through imaging of 3D NAND structures.
- Experience in 3D NAND technology and semiconductor manufacturing.
- Strong computer skills, including MS Office, JMP, and programming languages such as MATLAB, Python, C, C++.
- 2+ years in industry metrology experience working with SEMREG, CDSEM, or overlay/registration.
- Process and equipment related experience in instrumentation and calibration procedures.
- Strong understanding of semiconductor manufacturing processes (Deposition, Etch, Lithography, Diffusion) and device process flows (NAND, DRAM).
- Strong data analysis skills and a high level of attention to detail.
- The ability to work as individual contributor on projects or in collaboration with a team.
- Excellent communication, organizational, and interpersonal skills.
- Capable of international travel up to 3-6 months.
Education:
We are seeking candidates with a Masters or PhD degree in Engineering, Physics, Chemistry, Material Science, or a related field, specifically with a primary focus on Metrology. Alternatively, if you have a Bachelor's degree or equivalent experience in the semiconductor field and a proven track record of 5 years, we encourage you to apply.